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  • Damage assessment of parchment by micro-thermal analysis and scanning electron microscopy
  • J de Groot
  • M Odlyha ,L Bozec, M A Horton, A Masic, S Coluccia
  • Scientific Research
  • Paper
  • parchment, scanning electron microscopy, environmental scanning electron microscopy, micro-thermal analysis, atomic force microscopy
  • English
  • 2005 The Hague
  • ICOM Committee for Conservation 14th Triennial Meeting The Hague 12-16 September 2005
  • 1-84407-253-3
  • James & James/Earthscan

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ICOM-CC_2005_The Hague_126.pdf
J de Groot; M Odlyha ,L Bozec, M A Horton, A Masic, S Coluccia. Damage assessment of parchment by micro-thermal analysis and scanning electron microscopy. In ICOM Committee for Conservation 14th Triennial Meeting The Hague 12-16 September 2005, pg. Paris: International Council of Museums (ICOM-CC): ISBN: 1-84407-253-3

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