Contribution Details
-
Atomic force microscopy for analyzing adhesion of paint and plastic surfaces
-
Michal Lukomski
-
Vincent Beltran, Michal Lukomski, Carolyn Carta, Katharina Hoeyng, Art Kaplan, Michael Schilling, Adam Stieg, Shivani Sharma, Kristen McCormick
-
Scientific Research
-
Paper
-
-
-
English
-
2017 Copenhagen
-
ICOM Committee for Conservation 18th Triennial Meeting Copenhagen Denmark 4-8 September 2017
-
978-92-9012-426-9
-
Pulido & Nunes; ICOM Committee for Conservation
Contribution Download
By downloading this contribution PDF you are agreeing to the Terms of Use.
ICOM-CC_2017_Copenhagen_180.pdf
Michal Lukomski; Vincent Beltran, Michal Lukomski, Carolyn Carta, Katharina Hoeyng, Art Kaplan, Michael Schilling, Adam Stieg, Shivani Sharma, Kristen McCormick. Atomic force microscopy for analyzing adhesion of paint and plastic surfaces. In ICOM Committee for Conservation 18th Triennial Meeting Copenhagen Denmark 4-8 September 2017, pg. Paris: International Council of Museums (ICOM-CC): ISBN: 978-92-9012-426-9